PNS|Kakinada
JNTUK Vice-Chancellor CSRK Prasad, who is also the chairman of the Andhra Pradesh Engineering, Agriculture & Pharmacy Common Entrance Test (AP EAP CET) 2025, released the online exam results on Sunday.
He was joined by Convenor Prof VV Subbarao and other officials. The Vice-Chancellor stated that out of 3,62,448 candidates who applied for the exam, 3,40,300 appeared at centres across the state, including two in Hyderabad.
A total of 2,57,509 candidates qualified, resulting in a pass percentage of 75.67. Rank cards will be uploaded to the EAP CET website, he added. He further noted that the results are available on the official EAP CET website at https://cets.apsche.ap.gov.in and can also be accessed via the ‘Mana Mithra’ WhatsApp governance number 9552300009.
Expressing his satisfaction, he highlighted that the results were released within 12 days of the exams. The Vice-Chancellor thanked the state government, the State Council for Higher Education officials, district and university officials, special observers, and subject experts for their cooperation in conducting the exam and preparing error-free question papers.
Regarding the Agriculture and Pharmacy streams, exams were held over four sessions on May 19 and 20. Of the 75,460 candidates who appeared, 67,761 qualified, recording a pass percentage of 89.80. For the Engineering stream, exams took place in ten sessions from May 21 to 27, with 2,64,840 candidates appearing and 1,89,748 qualifying, yielding a pass percentage of 71.65.
The Vice-Chancellor also mentioned that due to typographical errors, the options for two questions were changed.
Two cases of malpractice were reported, and a committee has been formed to investigate further. The results of candidates involved in malpractice are being withheld.
JNTUK In-charge Registrar Prof V Ravindranath, OSD Prof D Koteswar Rao, Convenor Prof VV Subbarao, Co-convenors Prof K Ramu and Prof N Sumathi, and coordinators Dr S Chandrasekhar, Dr V Jayaprasad, Dr Usha Devi, and Dr Dilipkumar attended the event.
